Testing hypotheses via orthogonalization

Ameer Dharamshi Speaker
 
Runjia Zou Co-Author
 
Daniela Witten Co-Author
University of Washington
 
Wednesday, Aug 5: 12:05 PM - 12:20 PM
3198 
Contributed Papers 
Thomas M. Menino Convention & Exhibition Center 
Classical hypothesis testing frameworks break down in contemporary settings in which null hypotheses are increasingly abstract, the same data are used to both generate and test hypotheses, and minimal assumptions about the underlying data are made. In this work, we propose a new framework for conducting valid hypothesis tests in broad contexts. We propose to add and subtract external noise generated from a symmetric shift-family to our data, X, to partition it into two pieces, X1 and X2. We provide a generic strategy for orthogonalizing X2 against X1 under the null hypothesis H0, then show that testing whether the orthogonalization was successful provides a valid test of H0 under mild assumptions. Remarkably, this framework extends naturally to the post-selection inference setting: we simply select a hypothesis on X1, then perform orthogonalization under the selected null. As our approach neither requires pre-specification of the selection mechanism, nor is restricted to a small class of data-generating distributions, it dramatically expands the settings for which valid post-selection inference can be conducted. We showcase the flexibility of our proposal in several case studies involving challenging pre-specified null hypotheses and post-selection inference scenarios.

Keywords

hypothesis testing

post-selection inference

orthogonalization

randomization

unsupervised learning 

Main Sponsor

Section on Statistical Learning and Data Science